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Search for "extended Kalman filter" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.

Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy

  • Christian Ritz,
  • Tino Wagner and
  • Andreas Stemmer

Beilstein J. Nanotechnol. 2020, 11, 911–921, doi:10.3762/bjnano.11.76

Graphical Abstract
  • to the applied bias voltage. A state observer based on an extended Kalman filter is used to continuously fit the resulting parabola. The output of the time-based controller is an estimation of the topography-induced frequency shift Δftopo (which is not affected by Δfrem), the surface potential Ulcpd
  • . Due to the nonlinearity of the system, nonlinear state estimation is required. The extended Kalman filter (EKF) is a straightforward and computationally efficient method for dealing with such systems. The implementation shown uses the notation of Simon [30]. The algorithm starts with an arbitrary
  • topography and electrostatic properties can be directly estimated and separated from the frequency-shift signal. The state-space representation of FM-KFM was derived and an extended Kalman filter was introduced as a state observer. The estimation uses a linearization around the output matrix of the Kelvin
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Published 15 Jun 2020
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